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Figure 7
Contact-mode three-dimensional AFM images of the sample with Eu coverage of 1.0 nm obtained before (a) and after (b) the high-temperature annealing.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 1| January 2015| Pages 91-98
https://doi.org/10.1107/S1600577514019705
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