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Figure 2
Measured spectra of the scattering from a SiO2 sample using a silicon-drift detector and Ni foil filters with the listed thicknesses. The inset shows details of the region near a typical region of interest (ROI) for the Cu Kα fluorescence. The dashed line is the 12.8 µm data corrected for the filter absorption below the edge.

Journal logoJOURNAL OF
ISSN: 1600-5775
Volume 22| Part 2| March 2015| Pages 436-445
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