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Figure 2
Measured spectra of the scattering from a SiO2 sample using a silicon-drift detector and Ni foil filters with the listed thicknesses. The inset shows details of the region near a typical region of interest (ROI) for the Cu Kα fluorescence. The dashed line is the 12.8 µm data corrected for the filter absorption below the edge.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 2| March 2015| Pages 436-445
https://doi.org/10.1107/S1600577515001320
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