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Figure 2
(a) Cantilever holder of the AFM. The red part shows the piezoelectric element that excites the cantilever at its resonance. (b) Top and side views of the AFM custom-made fast scanner. (c) Alignment of the high-speed cantilever with a SNOM optical fiber in proximity of a sample.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 6| November 2015| Pages 1364-1371
doi:10.1107/S1600577515016318
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