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Figure 4
(a) AFM image of DPPC bilayers deposited onto silicon under physiological conditions. (b) Several force spectroscopy curves acquired with the AFM showing the deflection of the cantilever as a function of the sample displacement (piezo motion): we observed the rupture of the bilayers once a vertical deflection of the cantilever in the range 100–150 nm is measured. The curves have been shifted by 6 nm in the X-axis for better clarity. (c) Associated XRR from which we evaluate the bilayer thickness of 5.5 nm. Experimental data (blue circles) and best fit (continuous red line). Inset: scattering length density profile evaluated from the best fit of the reflectivity data. (d) Current flowing in the Si3N4 cantilever once aligned with the X-ray beam.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 6| November 2015| Pages 1364-1371
doi:10.1107/S1600577515016318
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