The competitive growth of cubic domains in Ti1–xAlxN films studied by diffraction anomalous near-edge structure spectroscopy

Pinot, Y.; Tuilier, M.-H.; Pac, M.-J.; Rousselot, C.; Thiaudière, D.

doi:10.1107/S160057751501632X

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Figure 5
Raw and corrected Ti K-edge DANES and XANES spectra: (a) 200c reflection of TiN, (b) 111c reflection of Ti_0.54Al_0.46N, (c) 002h reflection of Ti_0.32Al_0.68N, (d) 200c reflection of Ti_0.54Al_0.46N.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 22| Part 6| October 2015| Pages 1440-1449

doi:10.1107/S160057751501632X

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