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Figure 5
Ru (101) crystallographic planes measured by X-ray high-angle reflectivity for multilayers with different periodic thicknesses.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 6| October 2015| Pages 1379-1385
doi:10.1107/S1600577515017828
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