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Figure 2
(a) White-beam X-ray topography of the (022) reflection of E6 diamond used for the 16-pixel detector; (b) birefringence image of E6 diamond used for the 16-pixel detector; (c) birefringence image of IIa diamond used for the 1024-pixel detector; (d) white-beam X-ray topography of the (220) reflection of an unqualified diamond due to several electrical active defects in the center area.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 6| September 2015| Pages 1396-1402
doi:10.1107/S1600577515014824
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