X-ray spectroscopy for chemistry in the 2-4 keV energy regime at the XMaS beamline: ionic liquids, Rh and Pd catalysts in gas and liquid environments, and Cl contamination in γ-Al2O3

Thompson, P.B.J.; Nguyen, B.N.; Nicholls, R.; Bourne, R.A.; Brazier, J.B.; Lovelock, K.R.J.; Brown, S.D.; Wermeille, D.; Bikondoa, O.; Lucas, C.A.; Hase, T.P.A.; Newton, M.A.

doi:10.1107/S1600577515016148

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Figure 12
(a) Normalized Cl K-edge and Rh L₃-edge XAFS spectra derived from notionally Cl-free Rh/Al₂O₃ catalyst samples as a function of Rh loading (5–0.5 wt% as indicated). (b) Close-up of the Cl K-edge region and (c) detail of the Rh L₃-edge.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 22| Part 6| October 2015| Pages 1426-1439

doi:10.1107/S1600577515016148

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