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Figure 3
(a) FESEM images on a patterned Cu overlayer on SiO2/Si. (b) High magnification view of the Cu overlayer region. Scale bars: 200 µm (a); 5 µm (b).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 6| September 2015| Pages 1524-1527
doi:10.1107/S1600577515015234
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