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Figure 5
Azimuthal plots of scattering intensity at (A) 260 eV, (B) 285.2 eV, (C) 286 eV and (D) 289 eV. From top to bottom are simulations of morphologies shown in schematics (white lines represent the preferential direction of TDMs) to the right and in the bottom row are experimentally collected scattering. Experimental scattering in (A) is collected at 270 eV. Experimental signal to noise in a single exposure limits the azimuthal traces to be, from top to bottom, 0.01 nm−1 to 0.08 nm−1, a smaller range than simulation allows.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 1| January 2016| Pages 219-227
doi:10.1107/S1600577515019074
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