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Figure 7
Influence of fluctuations on the shape of the X-ray profile close to the [111]c Bragg reflection of GaAs: (a) Gaussian distribution ([\mu_{\rm{P}}] = 200 layer) and (b) Poisson distribution. Parameters are defined in equations (13)[link] and (14)[link], respectively.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 2| March 2016| Pages 487-500
doi:10.1107/S1600577516000333
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