Figure 2
Scanning electron microscopy image of a nonmagnetic smart tip, which serves as detector for photoexcited electrons from the sample. The inner PtIr core constitutes the tunneling tip, which provides the tip current Itip. It is coated with insulating and metallic films except at the tip apex. The outer metallic layer is grounded to avoid potential charging through ejected electrons that travel from the sample to the sidewalls of the tip. |