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Figure 11
Spiderweb slits are used to select diffraction from either a nickel or ceria reference powder, both in the direct X-ray beam and 6 mm apart. (a) Diffraction intensities for three positions of the spiderweb slits. (b) A top-down view of (a), for a z-scan with 0.5 mm increment. The nickel selection at z = 0 mm is shown on the top of the graph, while ceria selection at z = 6 mm is shown on the bottom. Arrows at the top of (b) indicate the diffraction peaks from nickel, while arrows at the bottom indicate diffraction peaks from ceria.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 6| November 2016| Pages 1296-1304
https://doi.org/10.1107/S1600577516013084
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