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Figure 5
Numerical simulation of SXFM. Illumination at the sample plane obtained by wave-optical simulation (a) with and (b) without apodizing slit. (c) Binary mesh pattern used as a sample. (d) Horizontal line profiles of simulated SXFM data obtained using illuminations (a) and (b).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 1| January 2017| Pages 142-149
https://doi.org/10.1107/S1600577516017677
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