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Figure 1
Fluorescence intensity versus angle of incidence for samples immersed in deoxy­genated and non-de­oxy­genated UPW solutions containing 100 p.p.b. Cu. The critical angle for silicon is at 0.16°. A least-squares fit using a specific concentration profile yielded a particle height of 16.1 nm. Additional calculations for particles of height 15.6 and 16.6 nm are shown. Reproduced with permission from Singh (2004BB18).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 1| January 2017| Pages 283-287
https://doi.org/10.1107/S1600577516015484
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