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Figure 5
The residual error is shown as a function of FWHM for a number of fits performed using the Gaussian distribution to model the concentration profile of particles. As can be seen, the best fit occurs at approximately 2.8 nm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 1| January 2017| Pages 283-287
https://doi.org/10.1107/S1600577516015484
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