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Figure 3
X-ray fluorescence maps taken at APS 2-ID-D. Left-hand panels show the uncorrected data after quantification with a reference standard (in µg cm−2) and right-hand panels show the same maps after correction for thickness and attenuation of incident and fluorescence photons (in at.%). Note that the counter-intuitive change from high to low concentration observed in the copper and gallium maps is the result of the thickness correction. The apparent high concentration in uncorrected maps is due to increased sample thickness in the center of grains, although with respect to stoichiometry, these regions are copper/gallium poor.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 1| January 2017| Pages 288-295
https://doi.org/10.1107/S1600577516015721
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