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Figure 4
Copper X-ray fluorescence maps of the same CIGS sample, taken at two beamlines with different geometries and beam intensity. AFM map with delineated grain boundaries presents a comparison with the grain sizes obtained using the watershed technique.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 1| January 2017| Pages 288-295
https://doi.org/10.1107/S1600577516015721
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