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Figure 5
I/I0 values for (a) copper, (b) gallium, (c) indium and (d) selenium as a function of CIGS layer thickness for five different grading profiles all assuming the same average film composition. The insets in (b) and (d) refer to all panels. The difference in scale for (c) should be noted when compared with (a), (b) and (d).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 1| January 2017| Pages 288-295
https://doi.org/10.1107/S1600577516015721
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