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Figure 6
I/I0 values for copper (a), gallium (b), indium (c) and selenium (d) as a function of the CIGS layer thickness for five different surface roughnesses, from ±10% of the film thickness to ±100% of the film thickness. The difference in scale for (c) should be noted when compared with (a), (b) and (d). The white box across the reference line at 2 µm in all panels represents a typical CIGS film with 10% surface roughness.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 1| January 2017| Pages 288-295
https://doi.org/10.1107/S1600577516015721
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