Quantitative characterization of the X-ray beam at the Australian Synchrotron Imaging and Medical Beamline (IMBL)

Stevenson, A.W.; Crosbie, J.C.; Hall, C.J.; Häusermann, D.; Livingstone, J.; Lye, J.E.

doi:10.1107/S1600577516015563

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Figure 10
Schematic diagram (not to scale) (left) and photograph (right) of one of the DCLM Si crystals. The disposition of the diagram is such that, for the first crystal, the X-ray beam would be incident from the right and diffract from the (111) Bragg planes, with the [ $[1\bar10]$ ] rotation axis pointing away from the storage ring. In the case of the second crystal, the singly diffracted X-ray beam would be incident from the left and diffract from the ( $[\bar1\bar1\bar1]$ ) Bragg planes, with the [ $[1\bar10]$ ] rotation axis pointing toward the storage ring, i.e. [ $[\bar110]$ ] points away in this case. The crystals are designed so that the (113) (first crystal) and ( $[\bar1\bar1\bar3]$ ) (second crystal) Bragg planes (shown dashed) can also be utilized for higher X-ray energies.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 24| Part 1| January 2017| Pages 110-141

https://doi.org/10.1107/S1600577516015563

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