Figure 13
(a). Experimental LEFAC currents for the `rotating-filter' method, using the APS A wiggler (with 15 and 20 mm gaps). Four different ex vacuo filter combinations have been used and rotated over the range ±80°: F1′, 4.5 mm Al; F2′, 0.25 mm Cu; F3′, 0.105 mm Mo; F4′, 50 µm Au; all in between 0.5 mm Al sheets. The three short horizontal lines for each wiggler gap mark the values of IC current used in the subsequent analysis. (b). Results of the analysis of data in (a). is the standard deviation (%) for the average of the four calculated IC currents (for F1′ to F4′). Each curve corresponds to one of the horizontal lines in (a). The spec.exe calculations were performed with X-ray energies from 1 to 1000 keV in 0.1 keV steps; 20 µm steps across the extent of the beam (horizontally and vertically); include emittance effects. The two vertical arrows indicate the wiggler-field values from TB-11. See text for further details. |