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Figure 4
(a) Measurement geometry in the ARPES chamber. The coordinate axes x, y and z are fixed in the laboratory frame of reference. Photoelectrons are detected in the xz plane under the acceptance angle −30° [\leq] α [\leq] +30° centered on the x axis. The synchrotron beam enters at an angle [\beta] = 60° with respect to the x axis, the polarization vector of horizontal light is in the xy plane. The sample can be moved in the x, y and z directions, and rotated about the z (polar angle θ) and y′ (tilt angle ψ) axes, as well as about the surface normal [{\bf n}] (azimuthal angle φ). (b) Scanning scheme of angle-scanned photoelectron diffraction in the spherical coordinate system in stereographic projection. A full scan of emission angles in the hemisphere is a combination of polar (θ) and azimuthal (φ) scans. Each of the curved lines in the plot corresponds to the angle range detected in one shot. For clarity, only a few angles are shown.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 1| January 2017| Pages 354-366
https://doi.org/10.1107/S1600577516018646
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