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Figure 9
Angle-resolved photoelectron diffraction of the N 1s peak of h-BN/Ni(111) at [E_{{{\rm kin}}}] = 399 eV. (a, b) Cluster of atoms used in calculations in (a) top view and (b) side view. (c) Processed experimental data. The raw data consist of short XPS spectra (11 s each) measured at 2148 angular settings distributed over the hemisphere (15° steps in φ and 1° steps in θ). The hemispherical diffractogram is assembled from 50° wide detector images, normalized, and three-fold averaged as described in the text and the supporting information. The diffraction cones from scattering along the N–N and N–B nearest-neighbor directions [corresponding to the dashed arrows in panel (a)] are marked by dashed circles. (d) Calculated diffractogram from the best-fit structural model. The pattern is twofold averaged to match the symmetry of the measurement.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 1| January 2017| Pages 354-366
https://doi.org/10.1107/S1600577516018646
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