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Figure 7
(a) Si 2p and (b) C 1s XP spectra series recorded during the exposure of a rutile TiO2(110) single-crystal held at 523 K to 2 × 10−2 mbar of TEOS. The spectra were measured alternately, and the time stamp is that of the start of the Si 2p measurement followed by that of the C 1s region. The intensity scale is: blue, high; red, low. The TEOS valve was opened during the initial scans, and the pressure reached the final pressure of 2 × 10−2 mbar after around 300 to 400 s, i.e. at the same time as the TEOS Si 2p and C 1s signals appear. The initial C 1s intensity is due to residual gas adsorption. The overall decreasing intensity in the C 1s spectra is due to the movement of the sample to avoid beam damage. The Si 2p spectra were corrected for this intensity loss, but not the C 1s spectra due to problems in the data analysis.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 1| January 2017| Pages 344-353
https://doi.org/10.1107/S1600577516019056
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