Computer-assisted area detector masking

Wright, C.J.; Zhou, X.-D.

doi:10.1107/S1600577517000157

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 1
Masked experimental scattering from Pr₂NiO₄. Clockwise from the top left: raw image, resulting mask, integrated intensity with and without a mask from 28 to 31 Å⁻¹, full integrated intensity with and without a mask.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 24| Part 2| March 2017| Pages 506-508

https://doi.org/10.1107/S1600577517000157

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