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Figure 2
Si K-edge extended X-ray absorption fine structure (EXAFS) spectra measured at different Si KLL: Auger peak (1608 eV) and background peak (1628 eV), indicated as blue and red lines, respectively. The brackets indicate the peak caused by photoelectron crossing electron energy windows for the Auger and background spectra.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 2| March 2017| Pages 445-448
https://doi.org/10.1107/S1600577516019676
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