view article
Figure 1
Corrected predictions and measured reflectivity curves of Si(660) and Si(553) analysers. Three different curves are shown for each analyser corresponding to different mask aperture sizes.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 2| March 2017| Pages 545-546
https://doi.org/10.1107/S1600577516019287
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS