Point focusing with flat and wedged crossed multilayer Laue lenses

Kubec, A.; Melzer, K.; Gluch, J.; Niese, S.; Braun, S.; Patommel, J.; Burghammer, M.; Leson, A.

doi:10.1107/S1600577517001722

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 11
(a, b) Scanning transmission measurements with a PIN-diode of the same region of the Siemens star with the wedged MLL as focusing optics. Fast scanning axis is horizontal and vertical, respectively. The grayscale shows the transmitted intensity of the beam. (c) The reconstructed phase image of the same region of the test sample. Measurement was made with the setup shown in Fig. 4

(b).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 24| Part 2| March 2017| Pages 413-421

https://doi.org/10.1107/S1600577517001722

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page