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![[Figure 1]](ve5058fig1mag.jpg)
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Figure 1
Experimental setup. (a) Basic sketch of the nano-focus instrument (GINIX setup at P10 beamline PETRAIII) and data acquisition scheme. The monochromatic beam is focused by a KB mirror system, placed 88 m upstream from the undulator source. The beam size in front of the KB is controlled by two pairs of slits. For the MMP scheme, the empty beam intensity distribution, represented by a `P', is recorded at different defocus positions z (blue translations) along the optical axis with no additional object in the beam path. Contrarily, the NFP scheme (red translations) requires an additional test object placed (Siemens star) at varied defocus positions z01 and an overlapping scan in the transversal direction, while the detector distance is fixed. (b) Example of the beam intensity distribution recorded for z = 0.3346 m for a 400 µm × 400 µm slit opening. Scale bar: 100 µm. (c) Intensity distribution along the principle axis (horizontal, vertical) in the focal plane, as simulated numerically by a Huygens principle approach (Osterhoff & Salditt, 2011  ) for a 100 µm × 100 µm slit setting, and the measured height profile of the mirrors. (d) Deviations from the ideal height profile for the vertical focusing mirror, shown for the original and upgraded mirror. |
![[Figure 1]](ve5058fig1.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
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