Nanofabrication and characterization of a grating-based condenser for uniform illumination with hard X-rays

Liu, J.; Li, X.; Chen, S.; Zhang, S.; Xie, S.; Xu, C.; Chen, Y.; Deng, B.; Mao, C.

doi:10.1107/S1600577517002247

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 5
Optical measurement results at the beamline. (a) Image of the fabricated condenser on the focal plane by the visible microscope with X-rays at 10 keV. (b) Measured intensity distribution in 3D at the focal plane.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 24| Part 3| May 2017| Pages 595-599

https://doi.org/10.1107/S1600577517002247

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