Figure 2
A series of TXM images with 1 s exposure are captured to monitor radiation damage on a Ge0.9Se0.1 electrode in electrolyte environment under 11.2 keV photon energy. The TXM images show (a) 1 s (left) and 30 min (right) irradiated Ge0.9Se0.1 particle cluster with 37.7 nm pixel resolution. (b) The increment of particle distances is tracked by the accumulated X-ray dose. |