view article
Figure 1
Wavefront perturbation (h) and SU8 refractive structure thickness (t) versus transverse position at the plane of the focusing optical element to produce a broadening of the focus to 5 µm at an X-ray energy of 15 keV.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 4| July 2017| Pages 744-749
https://doi.org/10.1107/S1600577517006038
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS