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Figure 1
Typical Laue microdiffraction image obtained from a Si single-crystal (Petit et al., 2015BB23). The rectangle around a Laue spot represents the correlation window used for DIC.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 4| July 2017| Pages 802-817
https://doi.org/10.1107/S1600577517006622
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