view article
Figure 12
Sketch of the four-point bending test performed on a Si monocrystalline specimen. The line scanned with Laue microdiffraction is indicated. The x and y dimensions are along the thickness (2.42 mm) and length (35 mm) of the specimen, respectively, while the out-of-plane dimension is along the width (7.97 mm) of the specimen.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 4| July 2017| Pages 802-817
https://doi.org/10.1107/S1600577517006622
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS