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Figure 13
Stress profiles obtained for the bent Si single-crystal at different detector–sample distances: (a) 59.8 mm, (b) 101.7 mm, (c) 143.8 mm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 4| July 2017| Pages 802-817
https://doi.org/10.1107/S1600577517006622
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