Accuracy of stress measurement by Laue micro­diffraction (Laue-DIC method): the influence of image noise, calibration errors and spot number

Zhang, F.G.; Bornert, M.; Petit, J.; Castelnau, O.

doi:10.1107/S1600577517006622

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Figure 5
(a) Average versus variance of gray levels for pixels corresponding to a specific spot obtained on a Si specimen. (b) Plot of γ versus $[(\sigma^2_{\rm d}-p_{\rm d}\gamma)]$ of all Laue spots of the LMDIs measured on Si, Ge, Cu and Fe specimens.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 24| Part 4| July 2017| Pages 802-817

https://doi.org/10.1107/S1600577517006622

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