journal menu
![[Figure 4]](rv5065fig4mag.jpg)
|
|
Figure 4
Schematic diagram of peak–peak monitoring and inflection–peak monitoring of the incident X-ray energy. (a) The peak point of Se within the crystal located at the peak point of elemental Se. Thus, the peak point of the standard sample (elemental Se) was used to monitor the energy at the peak point of the crystal, abbreviated as peak–peak monitoring. (b) When the peak point of Se inside the crystal is located on the steep rising part of the absorption edge of the standard sample (selenium dioxide), it is able to use the region near the inflection point of the standard sample to monitor the energy at the peak point of the crystal. This is called inflection–peak monitoring. |
![[Figure 4]](rv5065fig4.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
