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Figure 2
Comparison of reflectivity profiles measured with the in situ apparatus and a conventional laboratory diffractometer. The intensities have been normalized to match in the total external reflection region at small q. Here, and in the other figures, log refers to base-10 logarithm while ln refers to natural (base e) logarithm

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 4| July 2017| Pages 796-801
https://doi.org/10.1107/S1600577517008013
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