X-ray reflectivity measurement of interdiffusion in metallic multilayers during rapid heating

Liu, J.P.; Kirchhoff, J.; Zhou, L.; Zhao, M.; Grapes, M.D.; Dale, D.S.; Tate, M.D.; Philipp, H.T.; Gruner, S.M.; Weihs, T.P.; Hufnagel, T.C.

doi:10.1107/S1600577517008013

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Figure 3
(a) Evolution of the X-ray reflectivity of an Al/Ni multilayer with nominal bilayer period $[\Lambda]$ = 25 nm during heating at 40 K s⁻¹. Each exposure was 100 ms. The inset shows the first low-angle scattering peak in more detail. (b) Evolution of peak intensity, plotted as ln[I(T)/I(473 K)], with time for determination of $[\tilde{D}]$ .

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 24| Part 4| July 2017| Pages 796-801

https://doi.org/10.1107/S1600577517008013

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