Effects of temperature, mechanical motion and source positional jitter on the resolving power of beamline 02B at the SSRF

Guo, Z.; Meng, X.; Wang, Y.; Liu, H.; Zhang, X.; Li, Z.; Xue, L.; Tai, R.

doi:10.1107/S1600577517006087

Journal of Synchrotron Radiation Journal of
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Figure 13
Excitation spectrum of N₂ gas measured using the ionization chamber downstream of the exit slit. The energy-resolving power is 1.05 × 10⁴ at 400.9 eV.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 24| Part 4| July 2017| Pages 877-885

https://doi.org/10.1107/S1600577517006087

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