Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers

Wiedorn, M.O.; Awel, S.; Morgan, A.J.; Barthelmess, M.; Bean, R.; Beyerlein, K.R.; Chavas, L.M.G.; Eckerskorn, N.; Fleckenstein, H.; Heymann, M.; Horke, D.A.; Knoška, J.; Mariani, V.; Oberthür, D.; Roth, N.; Yefanov, O.; Barty, A.; Bajt, S.; Küpper, J.; Rode, A.V.; Kirian, R.A.; Chapman, H.N.

doi:10.1107/S1600577517011961

Journal of Synchrotron Radiation Journal of
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Figure 3
Radial average of 15 patterns before (red) and after (green) installing the PSA. The average background intensity normalized to the number of X-ray pulses and their respective intensities is two orders of magnitude lower with the PSA in place.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 24| Part 6| November 2017| Pages 1296-1298

https://doi.org/10.1107/S1600577517011961

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