Characterization of a sCMOS-based high-resolution imaging system

Mittone, A.; Manakov, I.; Broche, L.; Jarnias, C.; Coan, P.; Bravin, A.

doi:10.1107/S160057751701222X

Journal of Synchrotron Radiation Journal of
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Figure 15
(a) Map of the gain of individual pixels. An average gain value of 0.473 with a standard deviation of 0.05% was calculated. (b) Map of the readout noise of individual pixels. The average readout noise was found to be 3.03 counts with a standard deviation of 0.3%. (c) Map of the full-well capacity of individual pixels. The mean full-well capacity was found to be 65503 counts with a deviation of less than 0.001%.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 24| Part 6| November 2017| Pages 1226-1236

https://doi.org/10.1107/S160057751701222X

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