view article
Figure 3
Soliton sample described in §2.1[link]. (a) HR-TEM image; the inset details the sample structure as designed for manufacturing; (b) dark-field (DF) image obtained micrograph realized using the diffraction spot marked in panel (c) by the arrow – the spot is elongated in a direction parallel to the interface. The white zones in the image thus correspond to crystalline grains having the growth axis perpendicular to this interface (i.e. columnar growth). In both cases above, the coloured scale bars correspond to the expected thickness of the various layers present in the sample. The same coloured code as in the inset of panel (a) is used. (c) Electron diffraction pattern originating from the sample.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 25| Part 1| January 2018| Pages 204-213
https://doi.org/10.1107/S1600577517015703
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS