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Figure 4
BaTiO3 thin layer sample described in §2.2[link]. (Left) Fast XRR curves (partial data, the total external reflection plateau is not shown) measured every minute for the sample exposed to the X-ray beam. One measurement took about 30 s. An evolution of the sample in the X-ray beam can be noticed: the arrows point out changes in the position of a broad supplementary oscillation appearing in the data, and moving through them during the X-ray exposure. The intensity colour scale is logarithmic and spans over three orders of magnitude, from white to black. (Right) Comparison of several XRR data recorded at different moments in time, extracted from the previous data set: the curves correspond to data recorded every ∼5 min. Besides the displacements of the intensity minima, the regions highlighted by arrows show the presence and displacement of a negative interference effect moving towards lower 2θ values. This effect and its origin will be discussed elsewhere.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 25| Part 1| January 2018| Pages 204-213
https://doi.org/10.1107/S1600577517015703
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