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Figure 5
Ni thin layer sample, detailed in §2.3[link]. (Left) Temperature evolution of the XRR signal recorded (every ∼30 s) during the in situ thermal annealing of the sample. The broad oscillations giving extra contrast (period of ∼2° in 2θ for low temperatures) correspond to the topmost capping layer. (Right) Temperature evolution of the XRD signal recorded under the same conditions, during the in situ thermal annealing of the sample. The colour scale is logarithmic in both cases and spans over nine (left panel) and four (right panel) orders of magnitude, from white to black. Several temperature regimes can be distinguished, which are discussed in more detail in the text.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 25| Part 1| January 2018| Pages 204-213
https://doi.org/10.1107/S1600577517015703
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