An IAEA multi-technique X-ray spectrometry endstation at Elettra Sincrotrone Trieste: benchmarking results and interdisciplinary applications

Karydas, A.G.; Czyzycki, M.; Leani, J.J.; Migliori, A.; Osan, J.; Bogovac, M.; Wrobel, P.; Vakula, N.; Padilla-Alvarez, R.; Menk, R.H.; Gol, M.G.; Antonelli, M.; Tiwari, M.K.; Caliri, C.; Vogel-Mikuš, K.; Darby, I.; Kaiser, R.B.

doi:10.1107/S1600577517016332

Journal of Synchrotron Radiation Journal of
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Figure 3
Fitting of the XRF spectrum of the RMX10 multilayer thin film (Cr/Al/Ni/Cu/Ti) deposited on 200 nm silicon nitride membrane (Si₃N₄) measured at 3.8 keV excitation energy collected with the Bruker SDD.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 25| Part 1| January 2018| Pages 189-203

https://doi.org/10.1107/S1600577517016332

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