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Figure 9
Experimental elemental sensitivities [cps/(µA µg cm−2)] determined using the Kα characteristic X-ray intensities produced from the measurement of the RMX10 reference sample at 10.5 and 6.75 keV excitation energies for both Bruker SDD configurations, with (no magnetic trap) and without the Be filter. The incident beam photocurrent refers to the silicon photodiode PD1 readings. The dotted curves represent respective elemental sensitivities calculated by means of the Monte Carlo program XMI-MSIM (Schoonjans et al., 2012BB61). For this comparison, a normalization was performed between the experimental and MC-generated elemental sensitivities at the measured Cu-Kα intensity.

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