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Figure 1
The at-wavelength metrology station at BESSY-II. Plane-grating monochromator beamline (c-PGM) and reflectometer at a bending-magnet port. The HiOS is indicated. IoC refers to ionization chamber. |
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Figure 1
The at-wavelength metrology station at BESSY-II. Plane-grating monochromator beamline (c-PGM) and reflectometer at a bending-magnet port. The HiOS is indicated. IoC refers to ionization chamber. |