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Figure 11
FoM mapping of HiOS incidence angle versus photon energy for low energies and Si and C coatings.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 25| Part 1| January 2018| Pages 100-107
https://doi.org/10.1107/S1600577517016800
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